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We study the electronic and magnetic states of as-grown annealed $M\text{Fe}_2\text{O}_4$(111)/$\text{Al}_2\text{O}_3$(111) ($M=\text{Co, Ni}$) thin films with various thicknesses grown on Si(111) substrates $\gamma$-$\text{Al}_2\text{O}_3$(111) buffer layers by using x-ray absorption spectroscopy (XAS) circular dichroism (XMCD), to investigate magnetically dead in these films. Although samples are formed near interface $\text{Al}_2\text{O}_3$ layer, we reveal that ferrimagnetic order is partially recovered post-deposition annealing at 973 K for 48 hours air. By analyzing line shapes XAS XMCD spectra, conclude that, layers, there a significant number vacancies $T_d$ sites spinel structure, which may be microscopic origin degraded $M\text{Fe}_2\text{O}_4$(111)